van der Zanden, KoenKoenvan der ZandenSchreurs, DominiqueDominiqueSchreursMenozzi, R.R.MenozziBorgarino, M.M.Borgarino2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3923Reliability testing of InP HEMT's using electrical stress methodsJournal article