Effects of hole and electron trapping on organic field-effect transistor transfer characteristic

Bolsée, J.C.J.C.BolséeManca, JeanJeanManca2021-10-192021-10-1920110379-6779https://imec-publications.be/handle/20.500.12860/18600Effects of hole and electron trapping on organic field-effect transistor transfer characteristicJournal article