Blomme, PieterPieterBlommeGovoreanu, BogdanBogdanGovoreanuVan Houdt, JanJanVan HoudtDe Meyer, KristinKristinDe Meyer2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7223Temperature dependent current and charge trapping in thick SiO2/ZrO2 stacksProceedings paper