Baert, RogierRogierBaertCiofi, IvanIvanCiofiRoussel, PhilippePhilippeRousselMattii, LucaLucaMattiiDebacker, PeterPeterDebackerTokei, ZsoltZsoltTokei2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30180System-level impact of interconnect line-edge roughnessProceedings paperhttps://ieeexplore.ieee.org/document/8430429/