The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes

Kaczer, BenBenKaczerFranco, JacopoJacopoFrancoToledano Luque, MariaMariaToledano LuqueRoussel, PhilippePhilippeRousselBukhori, M. F.M. F.BukhoriAsenov, AsenAsenAsenovSchwarz, BenediktBenediktSchwarzBina, MarkusMarkusBinaGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20888The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimesProceedings paperhttp://dx.doi.org/10.1109/IRPS.2012.6241839