Cron, AdamAdamCronMarinissen, Erik JanErik JanMarinissenGoel, Sandeep K.Sandeep K.GoelMcLaurin, TeresaTeresaMcLaurinBhatia, SandeepSandeepBhatia2021-10-272021-10-272019-03https://imec-publications.be/handle/20.500.12860/32765IEEE Std P1838: 3D test access standard under developmentBook chapterhttps://doi.org/10.1002/9783527697052.ch14