Write/erase degradation and disturb effects in source-side injection flash EEPROM devices

Wellekens, DirkDirkWellekensVan Houdt, JanJanVan HoudtGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaesFaraone, LorenzoLorenzoFaraone2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/1016Write/erase degradation and disturb effects in source-side injection flash EEPROM devicesJournal article