Simoen, EddyEddySimoenMitard, JeromeJeromeMitardDe Jaeger, BriceBriceDe JaegerEneman, GeertGeertEnemanDobbie, A.A.DobbieMyronov, M.M.MyronovWhall, T.T.WhallLeadly, D.D.LeadlyMeuris, MarcMarcMeurisHoffmann, Thomas Y.Thomas Y.HoffmannClaeys, CorCorClaeys2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/19793Low-frequency noise characterizations of strained germanium pMOSFETsJournal article