Ma, J.J.MaZhang, J.F.J.F.ZhangJi, ZhigangZhigangJiBenbakhti, BrahimBrahimBenbakhtiZhang, Wei DongWei DongZhangZheng, Xue FengXue FengZhengMitard, JeromeJeromeMitardKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroesenekenHall, S.S.HallRobertson, J.J.RobertsonChalker, P.P.Chalker2021-10-222021-10-2220140018-9383https://imec-publications.be/handle/20.500.12860/24172Characterization of negative-bias temperature instability of Ge MOSFETs with GeO2/Al2O3 stackJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6786032&queryText%3Dma+characterization+negative+bias