Xue, GangGangXueVan Houdt, JanJanVan HoudtWellekens, DirkDirkWellekensHaspeslagh, LucLucHaspeslaghLorenzini, MartinoMartinoLorenziniKeppens, BartBartKeppensMaes, HermanHermanMaes2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4954Study of secondary electron injection phenomena in deep sub-micron MOSFETs and flash cellsProceedings paper