Marcon, DenisDenisMarconKang, XuanwuXuanwuKangViaene, JohnJohnViaeneVan Hove, MarleenMarleenVan HoveSrivastava, PuneetPuneetSrivastavaDecoutere, StefaanStefaanDecoutereMertens, RobertRobertMertensBorghs, GustaafGustaafBorghs2021-10-192021-10-1920110026-2714https://imec-publications.be/handle/20.500.12860/19380GaN-based HEMTs tested under high temperature storage testJournal article10.1016/