Radiation hardness of SiGe and Ge-based CMOS technologies

Claeys, CorCorClaeysIacvo, C.C.IacvoMitard, JeromeJeromeMitardArora, R.R.AroraZhang, C.C.ZhangGalloway, K.K.GallowayFleetwood, D.D.FleetwoodSchrimpf, R.R.SchrimpfPoizat, M.M.PoizatSimoen, EddyEddySimoen2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18712Radiation hardness of SiGe and Ge-based CMOS technologiesProceedings paper