Zhang, J. F.J. F.ZhangJi, Z.Z.JiChang, M. H.M. H.ChangKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162007-12https://imec-publications.be/handle/20.500.12860/13259Real Vth instability of pMOSFETs under practical operation conditionsProceedings paper