Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memory

Zahid, MohammedMohammedZahidDegraeve, RobinRobinDegraeveBreuil, LaurentLaurentBreuilVan den Bosch, GeertGeertVan den BoschVan Houdt, JanJanVan Houdt2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/23429Instability study of high-k inter-gate dielectric stacks on hybrid floating gate flash memoryProceedings paper