A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline silicon

Chen, J.J.ChenCornagliotti, EmanueleEmanueleCornagliottiSimoen, EddyEddySimoenHieckmann, E.E.HieckmannWeber, J.J.WeberPoortmans, JefJefPoortmans2021-10-192021-10-1920111862-6254https://imec-publications.be/handle/20.500.12860/18657A deep level transient spectroscopy study on the interface states across grain boundaries in multicrystalline siliconJournal article