Lanza, MarioMarioLanzaCelano, UmbertoUmbertoCelanoFeng, Miao.Innovation Center of AdvaMiao.Innovation Center of AdvaFeng2021-10-242021-10-2420171385-3449https://imec-publications.be/handle/20.500.12860/28752Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setupsJournal articlehttps://link.springer.com/article/10.1007/s10832-017-0082-1