Duhayon, NatasjaNatasjaDuhayonClarysse, TrudoTrudoClarysseAlvarez, DavidDavidAlvarezEyben, PierrePierreEybenFouchier, MarcMarcFouchierVandervorst, WilfriedWilfriedVandervorstHellemans, L.L.Hellemans2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7533Two dimensional carrier profiling using scanning capacitance microscopyProceedings paper