Alian, AliRezaAliRezaAlianBrammertz, GuyGuyBrammertzDegraeve, RobinRobinDegraeveCho, Moon JuMoon JuChoCaymax, MattyMattyCaymaxDe Meyer, KristinKristinDe MeyerHeyns, MarcMarcHeyns2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20277Characterizing oxide traps in the InGaAs/Al2O3 system with sulfur passivationMeeting abstract