Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar Transistors

Simoen, EddyEddySimoenMerron, B.B.MerronDecoutere, StefaanStefaanDecoutere2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/882Low-Frequency Noise Assessment of Hot Carrier Degradation Effects in Poly-Emitter Bipolar TransistorsOral presentation