Combined atomic force microscope and acoustic wave devices: application to electrodeposition

Friedt, Jean-MichelJean-MichelFriedtChoi, Kang-HoonKang-HoonChoiFrancis, LaurentLaurentFrancisCampitelli, AndrewAndrewCampitelli2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6336Combined atomic force microscope and acoustic wave devices: application to electrodepositionOral presentation