Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory

Zahid, MohammedMohammedZahidDegraeve, RobinRobinDegraeveTang, BaojunBaojunTangLisoni, JuditJuditLisoniVan den Bosch, GeertGeertVan den BoschVan Houdt, JanJanVan HoudtBreuil, LaurentLaurentBreuilBlomme, PieterPieterBlommeArreghini, AntonioAntonioArreghini2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24876Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memoryProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6860601&contentType=Conference+Publications