Extended defect related excess low-frequency noise in Si junction diodes

Simoen, EddyEddySimoenVanhellemont, JanJanVanhellemontBosman, GijsGijsBosmanCzerwinsky, A.A.CzerwinskyClaeys, CorCorClaeys2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1492Extended defect related excess low-frequency noise in Si junction diodesProceedings paper