A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs

Sharma, P.P.SharmaTyaginov, S.S.TyaginovRauch, S.E.S.E.RauchFranco, JacopoJacopoFrancoKaczer, BenBenKaczerMakarov, A.A.MakarovVexler, M.I.M.I.VexlerGrasser, T.T.Grasser2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27296A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETsProceedings paperhttp://ieeexplore.ieee.org/document/7599677/