Brown, JamesJamesBrownTok, Kean HongKean HongTokGao, RuiRuiGaoJi, ZhigangZhigangJiZhang, WeidongWeidongZhangMarsland, John S.John S.MarslandChiarella, ThomasThomasChiarellaFranco, JacopoJacopoFrancoKaczer, BenBenKaczerLinten, DimitriDimitriLintenZhang, Jian FuJian FuZhang2024-02-122024-01-072024-02-1220232169-3536WOS:001122344800001https://imec-publications.be/handle/20.500.12860/43345A Pragmatic Model to Predict Future Device AgingJournal article10.1109/ACCESS.2023.3329077WOS:001122344800001HOT-CARRIER DEGRADATIONGENERATIONELECTRONMOSFETSTRAPSREGIMESIMPACT