Franco, JacopoJacopoFrancoKaczer, BenBenKaczerMitard, JeromeJeromeMitardToledano Luque, MariaMariaToledano LuqueEneman, GeertGeertEnemanRoussel, PhilippePhilippeRousselCho, Moon JuMoon JuChoKauerauf, ThomasThomasKaueraufWitters, LiesbethLiesbethWittersHikavyy, AndriyAndriyHikavyyHellings, GeertGeertHellingsRagnarsson, Lars-AkeLars-AkeRagnarssonHoriguchi, NaotoNaotoHoriguchiGrasser, T.T.GrasserHeyns, MarcMarcHeynsGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20690Reliability of SiGe Channel MOSProceedings paper