The impact of process variation and stochastic aging in nanoscale VLSI

Kiamehr, SamanSamanKiamehrWeckx, PieterPieterWeckxTahoori, MehdiMehdiTahooriKaczer, BenBenKaczerKukner, HalilHalilKuknerRaghavan, PraveenPraveenRaghavanGroeseneken, GuidoGuidoGroesenekenCatthoor, FranckyFranckyCatthoor2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26828The impact of process variation and stochastic aging in nanoscale VLSIProceedings paperhttp://ieeexplore.ieee.org/document/7574590/