De Wolf, IngridIngridDe WolfJacobs, Kristof J.P.Kristof J.P.Jacobs2021-10-242021-10-2420171526-1344https://imec-publications.be/handle/20.500.12860/28182Advances in failure analysis techniques for 3D-technologyJournal articlehttp://www.chipscalereview.com/issue/1706/ChipScale_May_Jun_2017.pdf