In-situ investigation of the impact of externally applied vertical stress on III-V bipolar transistor

Liu, YefanYefanLiuHiblot, GaspardGaspardHiblotGonzalez, MarioMarioGonzalezVanstreels, KrisKrisVanstreelsVelenis, DimitriosDimitriosVelenisBadaroglu, MustafaMustafaBadarogluVan der Plas, GeertGeertVan der PlasDe Wolf, IngridIngridDe Wolf2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/31212In-situ investigation of the impact of externally applied vertical stress on III-V bipolar transistorProceedings paperhttps://ieeexplore.ieee.org/document/8614573