Brammertz, GuyGuyBrammertzLin, DennisDennisLinAlian, AliRezaAliRezaAlianMerckling, ClementClementMercklingChang, MarkMarkChangWang, Wei-EWei-EWangPasslack, MatthiasMatthiasPasslackCaymax, MattyMattyCaymaxMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/16796Electrical properties of InGaAs/high-k oxide interfaces: measurement and simulationMeeting abstract