Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologies

Schreurs, DominiqueDominiqueSchreursVandenberghe, S.S.VandenbergheNauwelaers, BartBartNauwelaersvan Meer, HansHansvan MeerLyu, Jeong-hoJeong-hoLyuKubicek, StefanStefanKubicekDe Meyer, KristinKristinDe Meyer2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3806Versatile RF measurement system to thoroughly evaluate the non-linear behaviour of SOI versus bulk CMOS technologiesProceedings paper