De Wolf, IngridIngridDe WolfPhommahaxay, AlainAlainPhommahaxayWang, TengTengWangLinten, DimitriDimitriLintenGuerrieri, StefanoStefanoGuerrieri2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23735Failure analysis challenges for 3D stacked ICsMeeting abstract