Simicic, MarkoMarkoSimicicHellings, GeertGeertHellingsChen, Shih-HungShih-HungChenMyny, KrisKrisMynyLinten, DimitriDimitriLinten2022-08-182022-08-182022-08-182018-10-28978-1-5853-7302-40739-5159WOS:000786516300017https://imec-publications.be/handle/20.500.12860/40270ESD study on a-IGZO TFT device architecturesProceedings paper10.23919/EOS/ESD.2018.8509748978-1-5853-7302-4WOS:000786516300017Electrical & electronic engineeringThin film transistorsElectrostatic dischargeESDindium-gallium-zinc-oxideIGZO