Comparative study on the effects of PVT variations between a novel all-MOS current reference and alternative CMOS solutions

Windels, JindrichJindrichWindelsVan Praet, ChristopheChristopheVan PraetDe Pauw, HerbertHerbertDe PauwDoutreloigne, JanJanDoutreloigne2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/16551Comparative study on the effects of PVT variations between a novel all-MOS current reference and alternative CMOS solutionsProceedings paper