Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrate

De Roest, DavidDavidDe RoestYmeri, HasanHasanYmeriVandenberghe, S.S.VandenbergheStucchi, MicheleMicheleStucchiSchreurs, DominiqueDominiqueSchreursMaex, KarenKarenMaexNauwelaers, BartBartNauwelaers2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6212Some measurement results for frequency-dependent inductance of IC interconnects on a lossy silicon substrateJournal article