Hantschel, ThomasThomasHantschelSchulz, VolkerVolkerSchulzZschaetzsch, GerdGerdZschaetzschEyben, PierrePierreEybenVerhulst, AnneAnneVerhulstSchmidt, VolkerVolkerSchmidtVereecken, PhilippePhilippeVereeckenVan den Bosch, GeertGeertVan den BoschVandervorst, WilfriedWilfriedVandervorst2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12244Carrier profiling of a cross-sectioned silicon nanowire by scanning spreading resistance microscopyProceedings paper