Folkersma, StevenStevenFolkersmaBogdanowicz, JanuszJanuszBogdanowiczSchulze, AndreasAndreasSchulzePetersen, D.H.D.H.PetersenHansen, O.O.HansenHenrichsen, H.H.HenrichsenNielsen, P.F.P.F.NielsenVandervorst, WilfriedWilfriedVandervorst2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28348Electrical resistance measurements of individual nanometer-wide Si finsMeeting abstracthttps://www.european-mrs.com/material-and-device-integration-silicon-advanced-applications-emrs