Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental study

Cuduvally, RamyaRamyaCuduvallyMorris, RichardRichardMorrisOosterbos, GielGielOosterbosFerrari, PieroPieroFerrariFleischmann, ClaudiaClaudiaFleischmannForbes, Richard G.Richard G.ForbesVandervorst, WilfriedWilfriedVandervorst2023-04-122022-12-062023-04-1220220021-8979WOS:000886523000021https://imec-publications.be/handle/20.500.12860/40831Post-field ionization of Si clusters in atom probe tomography: A joint theoretical and experimental studyJournal article10.1063/5.0106692WOS:000886523000021EVAPORATED IONSSTATE