Truzzi, ClaudioClaudioTruzziPeeters, J.J.PeetersBeyne, EricEricBeyneChiadò Piat, A.A.Chiadò PiatSartori, M.M.Sartori2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/381Substrate Interconnect Architecture and IC Design Requirements for an D-Type MCM Active Test StructureProceedings paper