High Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu Systems

Möller, A.A.MöllerTrenkler, ThomasThomasTrenklerWenzel, C.C.WenzelDrescher, K.K.Drescher2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/774High Temperature EPMA in Combination with Depth Profiling and Scanning Techniques for Investigation pf WTi(N)-Cu SystemsOral presentation