Beyne, TimTimBeyneDhooghe, SiemenSiemenDhoogheRanea, AdrianAdrianRaneaSijacic, DaniloDaniloSijacic2022-05-122022-05-122022-05-122022978-3-030-99276-70302-9743WOS:000789419300005https://imec-publications.be/handle/20.500.12860/39797A Low-Randomness Second-Order Masked AESProceedings paper10.1007/978-3-030-99277-4_5978-3-030-99277-4WOS:000789419300005