Jansen, R. J. E.R. J. E.JansenGlass, B.B.GlassBoatella-Polo, C.C.Boatella-PoloThys, GeertGeertThysVerhaegen, ShaneShaneVerhaegenFranciscatto, GiancarloGiancarloFranciscattoWouters, JanJanWoutersLambrichts, DannyDannyLambrichtsVargas-Sierra, S.S.Vargas-SierraGonzalez Lujan, J. J.J. J.Gonzalez Lujan2023-01-052022-10-062023-01-052022naWOS:000848160100082https://imec-publications.be/handle/20.500.12860/40538Characterisation of the DARE180U MOSFET Channel Geometry TID Radiation SensitivityProceedings paper10.1109/RADECS47380.2019.9745671978-1-7281-5699-6WOS:000848160100082130 NMDEVICES