Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

Rybalchenko, YevheniiYevheniiRybalchenkoMinj, AlbertAlbertMinjMedina Silva, HenryHenryMedina SilvaVillarreal, R.R.VillarrealGroven, BenjaminBenjaminGrovenLin, DennisDennisLinPereira, L. M. C.L. M. C.PereiraMorin, PierrePierreMorinHantschel, ThomasThomasHantschelAfanasiev, ValeriValeriAfanasiev2024-01-232023-11-102024-01-2320230038-1101WOS:001088917300001https://imec-publications.be/handle/20.500.12860/43122Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substratesJournal article10.1016/j.sse.2023.108781WOS:001088917300001