Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysis

Meneghini, MatteoMatteoMeneghiniStocco, AntonioAntonioStoccoBertin, MMBertinMarcon, DenisDenisMarconMeneghesso, GaudenzioGaudenzioMeneghessoZanoni, EnricoEnricoZanoni2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21134Degradation of AlGaN/GaN HEMTs below the "critical voltage": a time-dependent analysisProceedings paper