New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applications

Asanovski, R.R.AsanovskiGrill, AlexanderAlexanderGrillFranco, JacopoJacopoFrancoPalestri, P.P.PalestriBeckers, ArnoutArnoutBeckersKaczer, BenBenKaczerSelmi, L.L.Selmi2023-06-012023-05-252023-06-0120222380-9248WOS:000968800700046https://imec-publications.be/handle/20.500.12860/41637New insights on the excess 1/f noise at cryogenic temperatures in 28 nm CMOS and Ge MOSFETs for quantum computing applicationsProceedings paper10.1109/IEDM45625.2022.10019388978-1-6654-8959-1WOS:000968800700046LOW-FREQUENCY NOISE