On the electrical characterization of grain boundaries in multicrystalline silicon

Chen, JiaheJiaheChenCornagliotti, EmanueleEmanueleCornagliottiHieckmann, EllenEllenHieckmannBehrendt, SimoneSimoneBehrendtWeber, JoergJoergWeberSimoen, EddyEddySimoenPoortmans, JefJefPoortmans2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/16848On the electrical characterization of grain boundaries in multicrystalline siliconMeeting abstract