Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETs

Rafi, J.M.J.M.RafiSimoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaCanmpabadal, F.F.CanmpabadalClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11073Impact of hot-carrier stress on gate-induced floating body effects and drain current transients of thin-gate-oxide partially depleted SOI NMOSFETsJournal article