OFF-state degradation of high-voltage tolerant nLDMOS-SCR ESD devices

Griffoni, AlessioAlessioGriffoniChen, Shih-HungShih-HungChenThijs, StevenStevenThijsKaczer, BenBenKaczerFranco, JacopoJacopoFrancoLinten, DimitriDimitriLintenDe Keersgieter, AnAnDe KeersgieterGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/19008OFF-state degradation of high-voltage tolerant nLDMOS-SCR ESD devicesJournal articlehttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5764501