Groeseneken, GuidoGuidoGroesenekenDe Wolf, IngridIngridDe WolfBellens, RudiRudiBellensMaes, HermanHermanMaes2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1240Observation of single interface traps in submicron MOSFET's by charge pumpingJournal article