Chang, Yun TzuYun TzuChangVan Dorpe, PolPolVan DorpeVan Hoof, ChrisChrisVan HoofSuss, AndreasAndreasSuss2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32686Electron transport response de-embedding for high-speed image sensorsProceedings paperhttps://doi.org/10.1117/12.2518208