NMOS transistor behaviour under CDM stress conditions and relation to other ESD models

Verhaege, KoenKoenVerhaegeLuchies, J. M.J. M.LuchiesRuss, ChristianChristianRussGroeseneken, GuidoGuidoGroesenekenKuper, F.F.Kuper2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/992NMOS transistor behaviour under CDM stress conditions and relation to other ESD modelsProceedings paper